[A-2-4] Temperature effects of constant bias stress on NFETs with Hf-based gate dielectric

Rino Choi, Byoung Hun Lee, Chadwin D. Young, Jang Hoan Sim, Gennadi Bersuker (1.International SEMATECH, 2.IBM assignee)

https://doi.org/10.7567/SSDM.2004.A-2-4