[A-2-4] Temperature effects of constant bias stress on NFETs with Hf-based gate dielectric

Rino Choi、Byoung Hun Lee、Chadwin D. Young、Jang Hoan Sim、Gennadi Bersuker (1.International SEMATECH、2.IBM assignee)

https://doi.org/10.7567/SSDM.2004.A-2-4