[A-7-4L] Effect of Strain on Static and Dynamic NBTI of pMOSFETs

Hong-Nien Lin、Horng-Chih Lin、Tiao-Yuan Huang、Chih-Hsin Ko、Chung-Hu Ge、C.-C. Lin、Chien-Chao Huang (1.Institute of Electronics, National Chiao-Tung University、2.National Nano Device Laboratories、3.Taiwan Semiconductor Manufacturing Company, Ltd.)

https://doi.org/10.7567/SSDM.2004.A-7-4L