[A-7-4L] Effect of Strain on Static and Dynamic NBTI of pMOSFETs

Hong-Nien Lin, Horng-Chih Lin, Tiao-Yuan Huang, Chih-Hsin Ko, Chung-Hu Ge, C.-C. Lin, Chien-Chao Huang (1.Institute of Electronics, National Chiao-Tung University, 2.National Nano Device Laboratories, 3.Taiwan Semiconductor Manufacturing Company, Ltd.)

https://doi.org/10.7567/SSDM.2004.A-7-4L