[P2-9] Evaluations of Scaling Properties for GOI MOSFETs in Nano-Scale

G. Du、X.Y Liu、Z.L. Xia、Y.K Wang、D.Q. Hou、J.F. Kang、R.Q. Han (1.Institute of Microelectronics, Peking University)

https://doi.org/10.7567/SSDM.2004.P2-9