[P2-9] Evaluations of Scaling Properties for GOI MOSFETs in Nano-Scale

G. Du, X.Y Liu, Z.L. Xia, Y.K Wang, D.Q. Hou, J.F. Kang, R.Q. Han (1.Institute of Microelectronics, Peking University)

https://doi.org/10.7567/SSDM.2004.P2-9