[P4-2] Width Effect on Hot-Carrier-induced Degradaton for 90nm Partially Depleted SOI CMOSFET

Chieh-Ming Lai, Yean-Kuen Fang, Chia-Che Hu, Wen-Kuan Yeh (1.Institute of Microelectronics, National Cheng Kung University, 2.Department of Computer Science Information Engineering, Shu-Te University, 3.Department of Electrical Engineering, National University of Kaohsiung)

https://doi.org/10.7567/SSDM.2004.P4-2