[P4-2] Width Effect on Hot-Carrier-induced Degradaton for 90nm Partially Depleted SOI CMOSFET

Chieh-Ming Lai、Yean-Kuen Fang、Chia-Che Hu、Wen-Kuan Yeh (1.Institute of Microelectronics, National Cheng Kung University、2.Department of Computer Science Information Engineering, Shu-Te University、3.Department of Electrical Engineering, National University of Kaohsiung)

https://doi.org/10.7567/SSDM.2004.P4-2