[P5-4] Transient charging and relaxation in high-k gate dielectrics and its implications

Byoung Hun Lee、Chadwin Young、Rino Choi、Jang Hoan Sim、George Brown、Gennadi Bersuker (1.International SEMATECH、2.IBM)

https://doi.org/10.7567/SSDM.2004.P5-4