[A-4-2] A novel inversion pulse measurement technique to investigate transient charging characteristics in high-k NMOS transistors

Rino Choi、B. H. Lee、H. K. Park、C.D. Young、J.H. Sim、S.C. Song、G. Bersuker (1.SEMATECH、2.IBM assignee、3.Gwanju Institute of Science and Technology)

https://doi.org/10.7567/SSDM.2005.A-4-2