[B-10-1] Impact of Body Bias Controlling in Partially Depleted SOI Devices with Hybrid Trench Isolation Technology
Toshiaki Iwamatsu, Mikio Tsujiuchi, Yuuichi Hirano, Tatsuhiko Ikeda, Futoshi Komatsu, Takashi Ipposhi, Shigeto Maegawa, Yuzuru Ohji
(1.Advanced Device Development Dept., Renesas Technology Corp., 2.Renesas Semiconductor Engineering Corp.)
https://doi.org/10.7567/SSDM.2005.B-10-1
