[B-3-2] Si Substrate Orientation Induced Worse Hot Carrier Degradation in Novel (110)/<111’> Oriented Devices

Sinclair Chiang、M.F. Lu、Y.C. Liu、S. Huang-Lu、W.T. Shiau、S.C. Chien (1.Central Research and Development Division, UMC)

https://doi.org/10.7567/SSDM.2005.B-3-2