[B-3-2] Si Substrate Orientation Induced Worse Hot Carrier Degradation in Novel (110)/<111’> Oriented Devices

Sinclair Chiang, M.F. Lu, Y.C. Liu, S. Huang-Lu, W.T. Shiau, S.C. Chien (1.Central Research and Development Division, UMC)

https://doi.org/10.7567/SSDM.2005.B-3-2