[B-6-1] MOSFET Harmonic Distortion up to the Cutoff Frequency: Measurement and Theoretical Analysis

Youichi Takeda、Dondee Navarro、Shingo Chiba、Tatsuya Ezaki、Mitiko Miura-Mattausch、Hans Jurgen Mattausch、Tatsuya Ohguro、Takahiro Iizuka、Masahiko Taguchi、Shigetaka Kumashiro、Shunsuke Miyamoto (1.Graduate School of Advanced Sciences of Matter、2.Research Center for Nanodevices and Systems, Hiroshima University、3.Semiconductor Technology Academic Research Center)

https://doi.org/10.7567/SSDM.2005.B-6-1