[B-6-1] MOSFET Harmonic Distortion up to the Cutoff Frequency: Measurement and Theoretical Analysis

Youichi Takeda, Dondee Navarro, Shingo Chiba, Tatsuya Ezaki, Mitiko Miura-Mattausch, Hans Jurgen Mattausch, Tatsuya Ohguro, Takahiro Iizuka, Masahiko Taguchi, Shigetaka Kumashiro, Shunsuke Miyamoto (1.Graduate School of Advanced Sciences of Matter, 2.Research Center for Nanodevices and Systems, Hiroshima University, 3.Semiconductor Technology Academic Research Center)

https://doi.org/10.7567/SSDM.2005.B-6-1