The Japan Society of Applied Physics

[B-8-3] Devices Characteristics and Aggravated Negative Bias Temperature Instability in PMOSFETs with Uniaxial Compressive Strain

Chia-Yu Lu、Horng-Chih Lin、Yi-Feng Chang、Tiao-Yuan Huang (1.Department of Electronics Engineering and Institute of Electronics, National Chiao Tung University)

https://doi.org/10.7567/SSDM.2005.B-8-3