Devices Characteristics and Aggravated Negative Bias Temperature Instability in PMOSFETs with Uniaxial Compressive Strain

Chia-Yu Lu; Horng-Chih Lin; Yi-Feng Chang; Tiao-Yuan Huang

doi:https://doi.org/10.7567/SSDM.2005.B-8-3

2005 International Conference on Solid State Devices and Materials

2005年9月12日〜 2005年9月15日
International Conference Center Kobe, Kobe, Japan

[B-8-3] Devices Characteristics and Aggravated Negative Bias Temperature Instability in PMOSFETs with Uniaxial Compressive Strain

Chia-Yu Lu、Horng-Chih Lin、Yi-Feng Chang、Tiao-Yuan Huang (1.Department of Electronics Engineering and Institute of Electronics, National Chiao Tung University)

https://doi.org/10.7567/SSDM.2005.B-8-3

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