[B-9-1] Efficient Reduction of Standby Leakage Current in LSIs for Use in Mobile Devices

H. Kudo, K. Ishikawa, Y. Mishima, S. Satou, F. Kihara, M. Okamoto, T. Ito, Y. Suzuki, T. Nomura, M. Kawano, K. Nishikawa, Y. Ozaki (1.Advanced CMOS Technology Lab., Fujitsu Labs Ltd., 2.MCU Technology. Dept., 3.Preocess Integration Dept., 4.Preocess Engineering Dept., 5.Product Engineering Dept., Fujitsu Ltd.)

https://doi.org/10.7567/SSDM.2005.B-9-1