An SOI-CMOS Active Magnetic Probe for High-Frequency Electromagnetic Emissions

Satoshi Aoyama; Shoji Kawahito; Takeshi Yasui; Masahiro Yamaguchi

doi:https://doi.org/10.7567/SSDM.2005.D-5-1

[D-5-1] An SOI-CMOS Active Magnetic Probe for High-Frequency Electromagnetic Emissions

Satoshi Aoyama、Shoji Kawahito、Takeshi Yasui、Masahiro Yamaguchi (1.Graduate School of Electronic Science and Technology, Shizuoka University、2.Research Institute of Electronics, Shizuoka University、3.Graduate School of Engineering, Tohoku University)

https://doi.org/10.7567/SSDM.2005.D-5-1

2005 International Conference on Solid State Devices and Materials

[D-5-1] An SOI-CMOS Active Magnetic Probe for High-Frequency Electromagnetic Emissions