[D-9-4] Mismatches under the Impact of Hot Carrier Stress in 0.15 μm Technology

S. Y. Chen、J. C. Lin、H. W. Chen、H. C. Lin、Z. W. Jhou、S. Chou、J. Ko、T. F. Lei、H. S. Haung (1.Institute of Mechatronics Engineering, National Taipei University of Technology、2.Special Technology Division, United Microelectronics Corporation、3.Department of Electronics Engineering, National Chiao Tung University)

https://doi.org/10.7567/SSDM.2005.D-9-4