[E-5-2] Reduction of Random Noise for CMOS Image Sensors with 2.2μm×2.2μm Pixel
Jongwan Jung, Jeong-Ho Lyu, Hwangyoon Klm, HyunWoo Lee, Je-Hyuck Song, Youngsub You, Hyunpil Noh, Duck-hyung Lee, Kinam Klm
(1.Technology Development Team, Memory Division, 2.Process Technology group, Memory Dlvlslon, Semiconductor Business, Samsung Electronlcs Co, Ltd.)
https://doi.org/10.7567/SSDM.2005.E-5-2