[E-5-2] Reduction of Random Noise for CMOS Image Sensors with 2.2μm×2.2μm Pixel

Jongwan Jung、Jeong-Ho Lyu、Hwangyoon Klm、HyunWoo Lee、Je-Hyuck Song、Youngsub You、Hyunpil Noh、Duck-hyung Lee、Kinam Klm (1.Technology Development Team, Memory Division、2.Process Technology group, Memory Dlvlslon, Semiconductor Business, Samsung Electronlcs Co, Ltd.)

https://doi.org/10.7567/SSDM.2005.E-5-2