Reduction of Random Noise for CMOS Image Sensors with 2.2μm×2.2μm Pixel

Jongwan Jung; Jeong-Ho Lyu; Hwangyoon Klm; HyunWoo Lee; Je-Hyuck Song; Youngsub You; Hyunpil Noh; Duck-hyung Lee; Kinam Klm

doi:https://doi.org/10.7567/SSDM.2005.E-5-2

[E-5-2] Reduction of Random Noise for CMOS Image Sensors with 2.2μm×2.2μm Pixel

Jongwan Jung, Jeong-Ho Lyu, Hwangyoon Klm, HyunWoo Lee, Je-Hyuck Song, Youngsub You, Hyunpil Noh, Duck-hyung Lee, Kinam Klm (1.Technology Development Team, Memory Division, 2.Process Technology group, Memory Dlvlslon, Semiconductor Business, Samsung Electronlcs Co, Ltd.)

https://doi.org/10.7567/SSDM.2005.E-5-2

2005 International Conference on Solid State Devices and Materials

[E-5-2] Reduction of Random Noise for CMOS Image Sensors with 2.2μm×2.2μm Pixel