[H-7-3] Bit Distribution and Reliability of High Density 1.5V FRAM Embedded with 130nm, 5LM Copper CMOS Logic

K.R. Udayakumar、K. Boku、K.A. Remack、J. Rodriguez、S.R. Summerfelt、F.G. Celii、S. Aggarwal、J.S. Martin、L. Hall、L. Matz、B. Rathsack、H. McAdams、T.S. Moise (1.Texas Instruments Inc.)

https://doi.org/10.7567/SSDM.2005.H-7-3