Bit Distribution and Reliability of High Density 1.5V FRAM Embedded with 130nm, 5LM Copper CMOS Logic

K.R. Udayakumar; K. Boku; K.A. Remack; J. Rodriguez; S.R. Summerfelt; F.G. Celii; S. Aggarwal; J.S. Martin; L. Hall; L. Matz; B. Rathsack; H. McAdams; T.S. Moise

doi:https://doi.org/10.7567/SSDM.2005.H-7-3

2005 International Conference on Solid State Devices and Materials

Sep 12, 2005 - Sep 15, 2005
International Conference Center Kobe, Kobe, Japan

[H-7-3] Bit Distribution and Reliability of High Density 1.5V FRAM Embedded with 130nm, 5LM Copper CMOS Logic

K.R. Udayakumar, K. Boku, K.A. Remack, J. Rodriguez, S.R. Summerfelt, F.G. Celii, S. Aggarwal, J.S. Martin, L. Hall, L. Matz, B. Rathsack, H. McAdams, T.S. Moise (1.Texas Instruments Inc.)

https://doi.org/10.7567/SSDM.2005.H-7-3

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