[H-9-1] Overview and Future Challenges of MRAM Technologies

S. Tehrani、B.N. Engel、J.M. Slaughter、M. Durlam、N. Rizzo、R. Dave、J. Sun、J. Janesky、S. Pietambaram、F. Mancoff (1.Freescale Semiconductor, Inc.)

https://doi.org/10.7567/SSDM.2005.H-9-1