Overview and Future Challenges of MRAM Technologies

S. Tehrani; B.N. Engel; J.M. Slaughter; M. Durlam; N. Rizzo; R. Dave; J. Sun; J. Janesky; S. Pietambaram; F. Mancoff

doi:https://doi.org/10.7567/SSDM.2005.H-9-1

2005 International Conference on Solid State Devices and Materials

Sep 12, 2005 - Sep 15, 2005
International Conference Center Kobe, Kobe, Japan

[H-9-1] Overview and Future Challenges of MRAM Technologies

S. Tehrani, B.N. Engel, J.M. Slaughter, M. Durlam, N. Rizzo, R. Dave, J. Sun, J. Janesky, S. Pietambaram, F. Mancoff (1.Freescale Semiconductor, Inc.)

https://doi.org/10.7567/SSDM.2005.H-9-1

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