[I-7-4] Theoretical Analysis of Breakdown Characteristics for Recessed Gate GaAs MESFETs

Takashi Shugo、Dumarpa Macarambon Jr.、Masaaki Kuzuhara (1.Department of Electrical and Electronics Engineering University of Fukui)

https://doi.org/10.7567/SSDM.2005.I-7-4