[I-8-1] Analysis of Trap-Parameter Dependence of Lag Phenomena and Current Collapse in GaN FETs

H. Takayanagi, H. Nakano, K. Itagaki, K. Horio (1.Faculty of Systems Engineering, Shibaura Institute of Technology)

https://doi.org/10.7567/SSDM.2005.I-8-1