[P3-5] Investigation of Accumulation-mode Vertical Double-gate MOSFET

M. Masahara、K. Endo、Y.-X. Liu、T. Matsukawa、S. O’uchi、K. Ishii、H. Takashima、E. Sugimata、E. Suzuki (1.National Institute of Advanced Industrial Science and Technology (AIST))

https://doi.org/10.7567/SSDM.2005.P3-5