The Japan Society of Applied Physics

[P4-3] Abnormal Disturb Mechanism of sub 100nm NAND Flash

S.-J. Joo, H.-J. Yang, H.-S. Kim, K.-H. Noh, H.-G. Lee, W.-S. Woo, J.-Y. Lee, M.-K. Lee, W.-Y. Choi, K.-P. Hwang, S.-Y. Shim, S.-K. Kim, J.-I. Kim, W.-S. Jung, D.-I. Kim, J.-R. Ahn, J.-S. Leem, S.-J. Chung, B.-S. Park, H.-Y. Lee, Y.-W. Kim, J.-C. Om, H.-H. Chang, G.-H. Bae (1.F Device D1 Team, Flash Division, Hynix Semiconductor Inc.)

https://doi.org/10.7567/SSDM.2005.P4-3