[P4-3] Abnormal Disturb Mechanism of sub 100nm NAND Flash

S.-J. Joo、H.-J. Yang、H.-S. Kim、K.-H. Noh、H.-G. Lee、W.-S. Woo、J.-Y. Lee、M.-K. Lee、W.-Y. Choi、K.-P. Hwang、S.-Y. Shim、S.-K. Kim、J.-I. Kim、W.-S. Jung、D.-I. Kim、J.-R. Ahn、J.-S. Leem、S.-J. Chung、B.-S. Park、H.-Y. Lee、Y.-W. Kim、J.-C. Om、H.-H. Chang、G.-H. Bae (1.F Device D1 Team, Flash Division, Hynix Semiconductor Inc.)

https://doi.org/10.7567/SSDM.2005.P4-3