[P4-5] Thorough Diagnoses of the Impact of Flash Memory Cell UV-State Threshold Voltage on the Cell Reliability and Program/Erase Cycling Endurance Performance

Victor Chao-Wei Kuo, Hann-Ping Hwang, Cheng-Tung Huang, Cih-Wen Chou, Shyang-Ming Tzeng, Chia-Ping Lai, Tzeng- Wen Tzeng, Yih-En Huang, Wei-Zhe Wong, Ching-Sung Yang, Saysamone Pittikoun (1.TD2, Device Department, Powerchip Semiconductor Corp.)

https://doi.org/10.7567/SSDM.2005.P4-5