[P4-5] Thorough Diagnoses of the Impact of Flash Memory Cell UV-State Threshold Voltage on the Cell Reliability and Program/Erase Cycling Endurance Performance

Victor Chao-Wei Kuo、Hann-Ping Hwang、Cheng-Tung Huang、Cih-Wen Chou、Shyang-Ming Tzeng、Chia-Ping Lai、Tzeng- Wen Tzeng、Yih-En Huang、Wei-Zhe Wong、Ching-Sung Yang、Saysamone Pittikoun (1.TD2, Device Department, Powerchip Semiconductor Corp.)

https://doi.org/10.7567/SSDM.2005.P4-5