Measurement of Inductive Coupling in Wireless Superconnect

Daisuke Mizoguchi; Noriyuki Miura; Yoichi Yoshida; Nobuhiko Yamagishi; Tadahiro Kuroda

doi:https://doi.org/10.7567/SSDM.2005.P5-10L

2005 International Conference on Solid State Devices and Materials

Sep 12, 2005 - Sep 15, 2005
International Conference Center Kobe, Kobe, Japan

[P5-10L] Measurement of Inductive Coupling in Wireless Superconnect

Daisuke Mizoguchi, Noriyuki Miura, Yoichi Yoshida, Nobuhiko Yamagishi, Tadahiro Kuroda (1.Keio University, Department of Electronics and Electrical Engineering)

https://doi.org/10.7567/SSDM.2005.P5-10L

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