The Japan Society of Applied Physics

[P6-6] A Comparative Study on the DC, Microwave Characteristics of 0.12 μm Double-Recessed Gate AlGaAs/InGaAs/GaAs PHEMTs Using a Dielectric Assisted Process

Jong-Won Lim, Ho-Kyun Ahn, Hong-Gu Ji, Woo-Jin Chang, Jae-Kyoung Mun, Haecheon Kim (1.High Speed IC Research Department, Basic Research Laboratory, Electronics and Telecommunications Research Institute)

https://doi.org/10.7567/SSDM.2005.P6-6