Scaling Trends and Mitigation Techniques for Soft Errors in Flip-Flops

Taiki Uemura; Yoshiharu Tosaka; Shigeo Satoh; Keiji Takahisa; Kichiji Hatanaka

doi:https://doi.org/10.7567/SSDM.2006.C-3-4

2006 International Conference on Solid State Devices and Materials

Sep 12, 2006 - Sep 15, 2006
PACIFICO Yokohama, Yokohama, Japan

[C-3-4] Scaling Trends and Mitigation Techniques for Soft Errors in Flip-Flops

Taiki Uemura, Yoshiharu Tosaka, Shigeo Satoh, Keiji Takahisa, Kichiji Hatanaka (1.Fujitsu Laboratories Ltd., 2.Research Center for Nuclear Physics, Osaka University)

https://doi.org/10.7567/SSDM.2006.C-3-4

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