Scaling Trends and Mitigation Techniques for Soft Errors in Flip-Flops

Taiki Uemura; Yoshiharu Tosaka; Shigeo Satoh; Keiji Takahisa; Kichiji Hatanaka

doi:https://doi.org/10.7567/SSDM.2006.C-3-4

2006 International Conference on Solid State Devices and Materials

2006年9月12日〜 2006年9月15日
PACIFICO Yokohama, Yokohama, Japan

[C-3-4] Scaling Trends and Mitigation Techniques for Soft Errors in Flip-Flops

Taiki Uemura、Yoshiharu Tosaka、Shigeo Satoh、Keiji Takahisa、Kichiji Hatanaka (1.Fujitsu Laboratories Ltd.、2.Research Center for Nuclear Physics, Osaka University)

https://doi.org/10.7567/SSDM.2006.C-3-4

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