[D-7-4] Analysis of hole trapping into pentacene FET by Optical Second Harmonic Generation and C-V measurements

Eunju Lim、Takaaki Manaka、Ryosuke Tamura、Mitsumasa Iwamoto (1.Department of Physical Electronics, Tokyo Institute of Technology)

https://doi.org/10.7567/SSDM.2006.D-7-4