High-temperature and UV-assisted C-V characterization of GaN MIS structures

Hiroki Kato; Marcin Miczek; Tamotsu Hashizume

doi:https://doi.org/10.7567/SSDM.2006.E-9-2

[E-9-2] High-temperature and UV-assisted C-V characterization of GaN MIS structures

Hiroki Kato, Marcin Miczek, Tamotsu Hashizume (1.Research Center for Integrated Quantum Electronics (RCIQE) and Graduate School of Information Science and Technology, Hokkaido University)

https://doi.org/10.7567/SSDM.2006.E-9-2

2006 International Conference on Solid State Devices and Materials

[E-9-2] High-temperature and UV-assisted C-V characterization of GaN MIS structures