[F-2-1] Overview and Future Challenges eDRAM Technologies

H. sugimura、T. Wake、K. Inoue、M. Hamada、H. Shirai、S. Arai、M. Takeuchi、T. Sakoh、M. Sakao、T. Tanigawa (1.Advanced Device Development Division, NEC Electronics Corporation)

https://doi.org/10.7567/SSDM.2006.F-2-1