Simulation of Atomic Scale Effects and Fluctuations in Nano-Scale CMOS

Asen Asenov; Andrew R. Brown; Gareth Roy; Craig Alexander; Antonio Martinez

doi:https://doi.org/10.7567/SSDM.2006.F-5-1

2006 International Conference on Solid State Devices and Materials

2006年9月12日〜 2006年9月15日
PACIFICO Yokohama, Yokohama, Japan

[F-5-1] Simulation of Atomic Scale Effects and Fluctuations in Nano-Scale CMOS

Asen Asenov、Andrew R. Brown、Gareth Roy、Craig Alexander、Antonio Martinez (1.Device Modelling Group, Department of Electronics and Electrical Engineering The University of Glasgow)

https://doi.org/10.7567/SSDM.2006.F-5-1

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