[F-5-3] 3D Statistical Simulation of Gate Leakage Fluctuations Due to Combined Interface Roughness and Random Dopants

S. Markov, A. R. Brown, B. Cheng, G. Roy, S. Roy, A. Asenov (1.EEE Dept., Univ. of Glasgow)

https://doi.org/10.7567/SSDM.2006.F-5-3