[F-5-3] 3D Statistical Simulation of Gate Leakage Fluctuations Due to Combined Interface Roughness and Random Dopants

S. Markov、A. R. Brown、B. Cheng、G. Roy、S. Roy、A. Asenov (1.EEE Dept., Univ. of Glasgow)

https://doi.org/10.7567/SSDM.2006.F-5-3