Quantitative Evaluation of Interface Trap Density in Ge-MIS Interfaces

Noriyuki Taoka; Keiji Ikeda; Yoshimi Yamashita; Naoharu Sugiyama; Shin-ichi Takagi

doi:https://doi.org/10.7567/SSDM.2006.J-6-1

2006 International Conference on Solid State Devices and Materials

Sep 12, 2006 - Sep 15, 2006
PACIFICO Yokohama, Yokohama, Japan

[J-6-1] Quantitative Evaluation of Interface Trap Density in Ge-MIS Interfaces

Noriyuki Taoka, Keiji Ikeda, Yoshimi Yamashita, Naoharu Sugiyama, Shin-ichi Takagi (1.MIRAI-ASRC, AIST Tsukuba West 7, 2.MIRAI-ASET, AIST Tsukuba West 7, 3.The University of Tokyo)

https://doi.org/10.7567/SSDM.2006.J-6-1

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