[P-3-10] Effect of Mobility Degradation and Supply Voltage on NBTI Induced Drain Current Degradation

Jone F. Chen, Dao-Hong Yang, Chih-Yung Lin, Shien-Yang Wu (1.Institute of Microelectronics, Department of Electrical Engineering, National Cheng Kung University, 2.Logic Technology Division/R&D, Taiwan Semiconductor Manufacturing Company)

https://doi.org/10.7567/SSDM.2006.P-3-10