[P-3-17] A New Statistical Evaluation Method for the Variation of MOSFETs

Syunichi Watabe, Shigetoshi Sugawa, Akinobu Teramoto, Tadahiro Ohmi (1.Graduate School of Engineering, Tohoku University, 2.New Industry Creation Hatchery Center, Tohoku University)

https://doi.org/10.7567/SSDM.2006.P-3-17