[P-3-17] A New Statistical Evaluation Method for the Variation of MOSFETs

Syunichi Watabe、Shigetoshi Sugawa、Akinobu Teramoto、Tadahiro Ohmi (1.Graduate School of Engineering, Tohoku University、2.New Industry Creation Hatchery Center, Tohoku University)

https://doi.org/10.7567/SSDM.2006.P-3-17