[P-3-20] Combined Negative Bias Temperature Instability and Hot Carrier Stress Effects in Low Temperature Poly-Si Thin Film Transistors

Chih-Yang Chen, Jam-Wem Lee, Wei-Cheng Chen, Hsiao-Yi Lin, Kuan-Lin Yeh, Po-Hao Lee, Ming-Shan Shieh, Shen-De Wang, Tan-Fu Lei (1.Institute of Electronics, National Chiao Tung University, 2.National Nano Device Laboratory, 3.Toppoly Optoelectronics Corp.)

https://doi.org/10.7567/SSDM.2006.P-3-20