Combined Negative Bias Temperature Instability and Hot Carrier Stress Effects in Low Temperature Poly-Si Thin Film Transistors

Chih-Yang Chen; Jam-Wem Lee; Wei-Cheng Chen; Hsiao-Yi Lin; Kuan-Lin Yeh; Po-Hao Lee; Ming-Shan Shieh; Shen-De Wang; Tan-Fu Lei

doi:https://doi.org/10.7567/SSDM.2006.P-3-20

[P-3-20] Combined Negative Bias Temperature Instability and Hot Carrier Stress Effects in Low Temperature Poly-Si Thin Film Transistors

Chih-Yang Chen、Jam-Wem Lee、Wei-Cheng Chen、Hsiao-Yi Lin、Kuan-Lin Yeh、Po-Hao Lee、Ming-Shan Shieh、Shen-De Wang、Tan-Fu Lei (1.Institute of Electronics, National Chiao Tung University、2.National Nano Device Laboratory、3.Toppoly Optoelectronics Corp.)

https://doi.org/10.7567/SSDM.2006.P-3-20

2006 International Conference on Solid State Devices and Materials

[P-3-20] Combined Negative Bias Temperature Instability and Hot Carrier Stress Effects in Low Temperature Poly-Si Thin Film Transistors